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- LFE3-35EA-6FN484I
Lattice Semiconductor Corporation LFE3-35EA-6FN484I Embedded FPGAs
295Outputs FIELD PROGRAMMABLE GATE ARRAY
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LFE3-35EA-6FN484I Tech Specifications
| Category | Embedded - FPGAs (Field Programmable Gate Array) | |
| Manufacturer | Lattice Semiconductor | |
| Factory Lead Time | 8 Weeks | |
| Mount | Surface Mount | |
| Mounting Type | Surface Mount | |
| Package / Case | 484-BBGA | |
| Number of Pins | 484Pins | |
| Number of I/Os | 295I/Os | |
| Operating Temperature | -40°C~100°C TJ | |
| Packaging | Tray | |
| Series | ECP3 | |
| Published | 2010 | |
| JESD-609 Code | e1 | |
| Part Status | Active | |
| Moisture Sensitivity Level (MSL) | 3 (168 Hours) | |
| Number of Terminations | 484Terminations | |
| ECCN Code | EAR99 | |
| Terminal Finish | Tin/Silver/Copper (Sn/Ag/Cu) | |
| HTS Code | 8542.39.00.01 | |
| Voltage - Supply | 1.14V~1.26V | |
| Terminal Position | BOTTOM | |
| Terminal Form | BALL | |
| Peak Reflow Temperature (Cel) | 250 |
| Supply Voltage | 1.2V | |
| Terminal Pitch | 1mm | |
| Time@Peak Reflow Temperature-Max (s) | 30 | |
| Base Part Number | LFE3-35 | |
| Pin Count | 484 | |
| Number of Outputs | 295Outputs | |
| Operating Supply Voltage | 1.2V | |
| Memory Size | 174.4kB | |
| Operating Supply Current | 18mA | |
| RAM Size | 165.9kB | |
| Programmable Logic Type | FIELD PROGRAMMABLE GATE ARRAY | |
| Number of Logic Elements/Cells | 33000Logic Elements/Cells | |
| Total RAM Bits | 1358848 | |
| Max Frequency | 375MHz | |
| Number of LABs/CLBs | 4125LABs/CLBs | |
| Combinatorial Delay of a CLB-Max | 0.379 ns | |
| Length | 23mm | |
| Height Seated (Max) | 2.6mm | |
| Width | 23mm | |
| REACH SVHC | No SVHC | |
| Radiation Hardening | No | |
| RoHS Status | ROHS3 Compliant | |
| Lead Free | Lead Free |
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LFE3-35EA-6FN484I Documents
Download datasheets and manufacturer documentation for LFE3-35EA-6FN484I
- DatasheetsECP3 Family Datasheet Product Selector Guide
- Other Related DocumentsSolving Intellegence, Vision, Connectivity Challenges at the Edge with ECP5? FPGAs
- PCN Design/SpecificationMultiple Devices Cu Wire 01/Jul/2013
- PCN Assembly/OriginAlternate Qualified Test Site 30/Sep/2013
- PCN PackagingAll Dev Pkg Mark Chg 12/Nov/2018
- ConflictMineralStatementLattice-Semiconductor-company-57.pdf
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